- in-circuit automatic testing
- Техника: автоматическая внутрисхемная проверка
Универсальный англо-русский словарь. Академик.ру. 2011.
in-circuit automatic testing
Смотреть что такое "in-circuit automatic testing" в других словарях:
Automatic test equipment — Automatic/automated test equipment (ATE) is any automated device that is used to quickly test printed circuit boards, integrated circuits, or any other related electronic components or modules. Nowadays, ATE devices are essentially always… … Wikipedia
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
Circuit Check — Type Private Company Founded 1978 Headquarters Maple Grove, Minnesota USA Number of locations 4 Key people … Wikipedia
Automatic Train Control — Japanese style ATC indicator. Automatic Train Control (ATC) is a train protection system for railways, ensuring the safe and smooth operation of trains on ATC enabled lines. Its main advantages include making possible the use of cab signalling… … Wikipedia
Circuit breaker — For other uses, see Circuit breaker (disambiguation). An air circuit breaker for low voltage (less than 1000 volts) power distribution switchgear … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
In-circuit test — (ICT) is an example of white box testing where an electrical probe tests a populated printed circuit board (PCB), checking for shorts, opens, resistance, capacitance, and other basic quantities which will show whether the assembly was correctly… … Wikipedia
Focal plane array testing — (under development sep 15)Focal Plane Array testing (FPA testing) is the test engineering process of validation and verification (V V) of operation of focal plane array imaging devices, device under test (DUT), at various levels of the… … Wikipedia
Integrated circuit — Silicon chip redirects here. For the electronics magazine, see Silicon Chip. Integrated circuit from an EPROM memory microchip showing the memory blocks, the supporting circuitry and the fine silver wires which connect the integrated circuit die… … Wikipedia
Fixtureless in-circuit test — (FICT) is a cost effective alternative to a bed of nails tester for in circuit testing of low to medium volumes of printed circuit board assemblies. It relies on a computerized optical inspection of the circuit assembly and positionable test… … Wikipedia
Semi-automatic transmission — Transmission types Manual Sequential manual Non synchronous Preselector Automatic Manumatic Semi automatic Electrohydraulic … Wikipedia
